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Electron Microscopy Sciences MAC Microanalysis Standard Beryllium Mount, 2, 3, or 5 mm

Supplier:  Electron Microscopy Sciences 80074BE

Encompass_Preferred

All of our standards are suitable for electron-beam energy dispersive or wavelength dispersive X-ray microanalysis systems. They are supplied with fully authenticated certificates of analyses and a location map for standard identification. Mounts are polished to 0.25 micron diamond and carbon coated. Supplied in 2, 3, or5 mm brass tube.
Type: Mounted
Size: 2, 3, or 5 mm

Catalog No. 50-266-84


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