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Terra Universal Cleanroom Probe Tips
Electropolished tips reduce contact resistance
Supplier: Terra Universal 911102
Description
Tip minimizes breakage and can be used for all automatic and manual wafer probing units.
- Taper length: 6mm (0.23 in.)
- Taper angle: 5°
- Tip radius: 0.0127mm (0.0005 in.)
- Shank diameter: 0.51mm (0.02 in.)
Specifications
| Automatic and Manual Wafer Probing Units | |
| 0.23 in. | |
| Tungsten |
| Probe Tip | |
| 0.58 cm |
Product Title
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