For Scanning Electron Microscopes with Energy Dispersive or Wavelength Dispersive X-ray systems to check the performance and ensure performance is within the manufactures specification.
Cobalt, compulsory for checking Energy Dispersive analyzers, and any other five selected standards*
Duplex Brass for checking the contrast efficiency of Back Scattered detectors and detecting two major copper/zinc phases of 0.1 atomic number difference.
A Faraday Cage for measuring the beam current at the specimen plane is in the center.
S168T gold crystals on a carbon background for checking the performance of the SEM at high-resolution with a finer than a 10 micron probe.
S1930 silicon test specimen with squares of periodicity 9.9 micrometers lines about 1.9 micrometers is used for magnification calibration and assessing image distribution.
*Excludes SRM 481, SRM 482 and SRM 1872 On 25mm diameter block.